Method and apparatus for ion deposition and etching

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156643, 156654, 20419211, 20419213, 20419234, 427 8, 427 38, B44C 122, C03C 1500, C23C 1400, B05D 306

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048774790

ABSTRACT:
The disclosure relates to maskless deposition and etching and more particularly to maskless deposition and etching of the surface of objects using single and multiple ion sources.

REFERENCES:
patent: 3548189 (1970-12-01), Meinel et al.
patent: 3699334 (1972-10-01), Cohen et al.
patent: 4367044 (1983-01-01), Booth, Jr. et al.
patent: 4405989 (1983-09-01), Tsukada et al.
patent: 4411733 (1983-10-01), Macklin et al.
patent: 4450031 (1984-05-01), Ono et al.
patent: 4457803 (1984-07-01), Takigawa
patent: 4523971 (1985-06-01), Cuomo et al.
Sensitive Technique for Measuring Apparent Optical Figure Error Caused by Coating Nonuniformity, by H. E. Bennett and D. K. Burge; Proc. Boulder Damage Symposium 1981, Laser Induced Damage in Optical Materials: 1981, NBS Special Pub. 638, pp. 421-425.
Fundamentals of Ion-Source Operation by Harold R. Kaufman.
Journal of Vacuum Science and Technology, vol. 15, pp. 272-276 Mar./Apr. 1978, by H. F. Kaufman, et al.

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