Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2006-10-17
2006-10-17
Iqbal, Nadeem (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C365S189090
Reexamination Certificate
active
07124325
ABSTRACT:
To trim interface devices on semiconductor devices, such as trimmable output drivers and terminations, a measurement current produced in the test apparatus is impressed onto the interface device, and a measurement voltage produced by the measurement current in the interface device is detected by a trimming unit provided within the semiconductor device and is trimmed using control elements and trimming registers controlled by the trimming unit. To this end, the trimming unit ascertains trimming information which is stored in nonvolatile fashion in a memory unit in the semiconductor device and is loaded into the trimming registers in the semiconductor device whenever the semiconductor device is started up.
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Hartmann Udo
Nerger Sascha
Greenberg Laurence A.
Infineon - Technologies AG
Iqbal Nadeem
Locher Ralph E.
Stemer Werner H.
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