Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2011-08-02
2011-08-02
Rodriguez, Paul L (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S013000, C716S030000
Reexamination Certificate
active
07991604
ABSTRACT:
A method and an apparatus for indirectly simulating a semiconductor integrated circuit (IC) are described. A circle chain is formed using input pins and output pins to provide an intellectual property (IP) core model that substitutes for a real IP core circuit. A test bench for the IP core model is generated, the semiconductor IC that includes the IP core model is integrated using the generated test bench, and the semiconductor IC is simulated.
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Riahi et al, Simulating Faults of Combinational IP Core-based SOCs in a PLI Environment, 2005, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 389-397.
Chad Aniss
Mills & Onello LLP
Rodriguez Paul L
Samsung Electronics Co,. Ltd.
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