Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-06-07
2005-06-07
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S225700, C327S053000, C327S525000, C257S529000
Reexamination Certificate
active
06903986
ABSTRACT:
A system is provided for use with an on-chip fuse. If the fuse (40) is to be blown, the system blows the fuse, then performs a test read by comparing it with a larger-than-normal reference resistance (41, 42). If, even using the larger-than-normal reference resistance, the fuse reads as blown, then it is possible to be much more confident that the fuse will read correctly when compared against the normal reference resistance (42), even with aging and with variations of temperature and supply. For future reads during normal operation, the system compares it with the normal reference resistance (42). If, on the other hand, the fuse does not read as blown during the test read then the device can be rejected as a failed device.
REFERENCES:
patent: 4773046 (1988-09-01), Akaogi et al.
patent: 6125069 (2000-09-01), Aoki
patent: 6268760 (2001-07-01), Marshall et al.
patent: 6346738 (2002-02-01), Kim et al.
patent: 6346846 (2002-02-01), Bertin et al.
patent: 6384664 (2002-05-01), Hellums et al.
patent: 6417720 (2002-07-01), Denham
Hejdeman Carl R. M.
McKnight Andrew
Nguyen Van-Thu
Oppedahl & Larson
Semtech Corporation
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