Electricity: electrical systems and devices – Safety and protection of systems and devices – Circuit interruption by thermal sensing
Reexamination Certificate
2008-01-08
2008-01-08
Sherry, Michael (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Circuit interruption by thermal sensing
Reexamination Certificate
active
07317605
ABSTRACT:
An apparatus and method is disclosed for improving timing margins of logic paths on a semiconductor chip. Typical logic embodiments, such as CMOS (Complementary Metal Oxide Semiconductor), have path delays that become shorter as supply voltage is increased. Embodiments of the present invention store product data on each particular chip. The product data includes, for examples, but not limited to, a voltage range having a low limit voltage and a high limit voltage, a limit temperature, and performance of the particular chip in storage for the particular chip. Each chip has a voltage controller, a timer, and a thermal monitor. The voltage controller communicates with a voltage regulator and dynamically causes a voltage supply coupled to the chip to be as high as possible in the voltage range, subject to the limit temperature.
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Temperature Sensor and System Monitor in a 10-Pin microMAX. MAXIM. Oct. 2001.
Donze Richard Lee
Hovis William Paul
Kueper Terrance Wayne
Sheets, II John Edward
Tetzloff Jon Robert
Clark Chrisotpher J
International Business Machines - Corporation
Sherry Michael
Williams Robert R.
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