Metal fusion bonding – Process – Plural joints
Reexamination Certificate
2006-02-21
2006-02-21
Johnson, Jonathan (Department: 1725)
Metal fusion bonding
Process
Plural joints
C228S246000
Reexamination Certificate
active
07000821
ABSTRACT:
A method and apparatus provides increased operative life for flip-chip devices that are produced from an integrated circuit formed with electrically conductive bumps bonded to a printed circuit board substrate. The bumps and the substrate are formed from similar materials that allow control of the degree of latency for each element and produce a covalently bonded laminate structure when the bumps and substrate are brought together. The covalently bonded structure decreases bump fatigue to lengthen the operative life of the flip-chip device.
REFERENCES:
patent: 5034801 (1991-07-01), Fischer
patent: 5237130 (1993-08-01), Kulesza et al.
patent: 5611140 (1997-03-01), Kulesza et al.
patent: 5656862 (1997-08-01), Papathomas et al.
patent: 6183588 (2001-02-01), Kelly et al.
patent: 6189208 (2001-02-01), Estes et al.
patent: 6219911 (2001-04-01), Estes et al.
patent: 6320250 (2001-11-01), Takahashi
patent: 6743660 (2004-06-01), Lee et al.
Chen Tim
Sterrett Terry
Intel Corporation
Johnson Jonathan
Kenyon & Kenyon
LandOfFree
Method and apparatus for improving an integrated circuit device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for improving an integrated circuit device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for improving an integrated circuit device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3663972