Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Bus or line termination
Reexamination Certificate
2008-05-27
2008-05-27
Barnie, Rexford (Department: 2819)
Electronic digital logic circuitry
Signal sensitivity or transmission integrity
Bus or line termination
Reexamination Certificate
active
07378866
ABSTRACT:
A method for trimming impedance matching devices in high-speed circuits includes determining an electrical parameter associated with a first tantalum nitride (TaN) resistor used as an impedance matching device in the circuit under test, and comparing the determined electrical parameter associated with the first TaN resistor to a desired design value of the electrical parameter. The resistance value of the first TaN resistor is altered by application of a trimming voltage thereto, wherein the trimming voltage is based on a voltage-resistance characteristic curve of the first TaN resistor. It is then determined whether the altered resistance value of the first TaN resistor causes the electrical parameter to equal the desired design value thereof, and the altering of the resistance value of the first TaN resistor by application of a trimming voltage is repeated until the electrical parameter equals the desired design value thereof.
REFERENCES:
patent: 5675310 (1997-10-01), Wojnarowski et al.
patent: 5680060 (1997-10-01), Banniza et al.
patent: 6586964 (2003-07-01), Kent et al.
patent: 6597198 (2003-07-01), Haycock et al.
patent: 6700161 (2004-03-01), Hsu et al.
patent: 6836170 (2004-12-01), Kitagawa et al.
patent: 2005/0113034 (2005-05-01), Mangino et al.
Tom Lee et al., Characterization and Reliability of Tan Thin Film Resistors, IEEE42nd Annual International Reliability Physics Symposium, 2004, 502-508pp.
Chen Fen
Feng Kai D
Gautheir Robert J
Lee Tom C
Barnie Rexford
Cantor & Colburn LLP
Hammond Crystal L
Harding W. Riyon
International Business Machines - Corporation
LandOfFree
Method and apparatus for impedance matching in transmission... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for impedance matching in transmission..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for impedance matching in transmission... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2754371