Method and apparatus for impasse detection and resolution

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C700S011000, C700S028000, C700S099000, C700S110000, C700S114000, C700S121000

Reexamination Certificate

active

07620470

ABSTRACT:
A method, apparatus and a system, for provided for performing an automated process flow adjustment. A semiconductor wafer is processed based upon a routing plan and a predetermined schedule. A fault detection relating to the processing of the semiconductor wafer is performed. Dynamically modifying the predetermined routing plan or the predetermined schedule based upon the fault detection. A predetermined process material delivery plan is dynamically modified based upon the modifying of the routing plan or modifying of the predetermined schedule.

REFERENCES:
patent: 4807108 (1989-02-01), Ben-Arieh et al.
patent: 5193065 (1993-03-01), Guerindon et al.
patent: 5347460 (1994-09-01), Gifford et al.
patent: 7051250 (2006-05-01), Allen et al.
patent: 7142939 (2006-11-01), Nonaka et al.
patent: 2002/0103726 (2002-08-01), Jones et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for impasse detection and resolution does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for impasse detection and resolution, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for impasse detection and resolution will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4108776

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.