Method and apparatus for high resolution ZQ calibration

Details Method and apparatus for high resolution ZQ calibration Method and apparatus for high resolution ZQ calibration

2011-03-01

2011-03-01

Tan, Vibol (Department: 2819)

Electronic digital logic circuitry

Signal sensitivity or transmission integrity

Bus or line termination

C327S108000, C365S189110

Reexamination Certificate

active

07898290

ABSTRACT:
A method is disclosed for controlling an output impedance of an electronic device of the type having an impedance control terminal to which an external load is to be connected such that a predetermined value of the voltage at the impedance control terminal controls the output impedance of the device. The method is comprised of comparing a reference voltage to a voltage at the impedance control terminal. A variable count signal representing a count value is produced in response to the comparing. The impedance of a variable impedance circuit is varied in response to the count signal, wherein the impedance of the variable impedance circuit controls the voltage at the impedance control terminal. A device connected in parallel with the variable impedance circuit is periodically operated to change (increase/decrease) the impedance of the variable impedance circuit. An apparatus for performing the method is also disclosed.

REFERENCES:
patent: 5254883 (1993-10-01), Horowitz et al.
patent: 6262625 (2001-07-01), Perner et al.
patent: 6807650 (2004-10-01), Lamb et al.
patent: 6836143 (2004-12-01), Song
patent: 6839286 (2005-01-01), Cho et al.
patent: 6947336 (2005-09-01), Kim et al.
patent: 6958613 (2005-10-01), Braun et al.
patent: 7362128 (2008-04-01), Choi et al.
patent: 7626416 (2009-12-01), Kim
patent: 2002/0063576 (2002-05-01), Kim et al.
patent: 2003/0218914 (2003-11-01), Kim et al.
patent: 2003/0231523 (2003-12-01), Cho et al.
patent: 2006/0158216 (2006-07-01), Aoyama et al.
patent: 2007/0040573 (2007-02-01), Batt
patent: 2007/0200591 (2007-08-01), Kim

Affiliated with

Also associated with

Rating

Method and apparatus for high resolution ZQ calibration does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for high resolution ZQ calibration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for high resolution ZQ calibration will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2768517