Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-01-10
2009-06-09
Garbowski, Leigh Marie (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07546567
ABSTRACT:
One embodiment of the present invention relates to a process that generates a clock-tree on an integrated circuit (IC) chip. During operation, the process starts by receiving a placement for a chip layout, where the placement includes a set of registers at fixed locations in the chip layout. The process then generates a timing criticality profile for the set of registers, wherein the timing criticality profile specifies timing criticalities between pairs of registers in the set of registers. Next, the process clusters the set of registers based on the timing criticality profile to create a clock-tree for the set of registers. By clustering the registers based on the timing criticality profile, the process facilitates using commonly-shared clock paths in the clock-tree to provide clock signals to timing critical register pairs.
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Cheon Yongseok
Ho Pei-Hsin
Garbowski Leigh Marie
Park Vaughan & Fleming LLP
Synopsys Inc.
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