Method and apparatus for functional testing of a memory which is

Details Method and apparatus for functional testing of a memory which is Method and apparatus for functional testing of a memory which is

1985-12-30

1988-07-05

Popek, Joseph A.

Static information storage and retrieval

Read/write circuit

Testing

G11C 700

Patent

active

047559705

ABSTRACT:
Method for the functional testing of a memory being electrically programmable word by word and including storage cells having storage transistors with given reading window widths during normal operation, which includes reducing the width of the reading windows of the storage transistors during a functional test, as compared to the given width during normal operation, and an apparatus for carrying out the method.

REFERENCES:
patent: 4087795 (1978-05-01), Rossler
patent: 4279024 (1981-07-01), Schrenk
W. S. Johnson et al., "16-K EE-PROM Relies on Tunneling for Byte-Erasable Program Storage", Electronics, Feb. 28, 1980, pp. 113-117.

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