X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1997-01-30
1999-04-06
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Absorption
378 58, 382152, G01N 2304
Patent
active
058928081
ABSTRACT:
A feature detection apparatus includes a reflective imaging system, a transmissive imaging system, and memory for generating an image of a workpiece. The reflective imaging system generates a first bit image of a surface of the workpiece. The transmissive imaging system generates a second, different bit image of the density of the workpiece. The two images are then combined in memory into a more complete image that contains data describing the surface and interior of the workpiece. The apparatus also includes a filter for enhancing the combined bit image so that physical features of the workpiece are accurately detected. The filter is constructed to perform the following steps. For detecting a feature of interest, the filter determines a mean, standard deviation, and normal distribution of the image's pixel intensities. The filter then uses the normal distribution to map the pixel intensities above the mean to one set of enhanced pixel intensities and to map pixel intensities below the mean to another set of enhanced pixel intensities. Pixels of the enhanced image are sampled to determine if a pixel meets a threshold intensity for the feature being sought. For a pixel that meets the threshold intensity, a feature detection operation is applied to the pixel and its neighboring pixels to determine if the feature is present in the image. If so, the full extent of the detected feature is then determined.
REFERENCES:
patent: 3120861 (1964-02-01), Finlay et al.
patent: 3471702 (1969-10-01), VanVeld
patent: 3574470 (1971-04-01), Paine
patent: 3591291 (1971-07-01), Grear-Ypsilanti
patent: 3694658 (1972-09-01), Watson et al.
patent: 3849793 (1974-11-01), Ablett
patent: 3890509 (1975-06-01), Maxey
patent: 3970128 (1976-07-01), Kohlberg
patent: 3983403 (1976-09-01), Dahlstrom et al.
patent: 4086496 (1978-04-01), Berry
patent: 4092068 (1978-05-01), Lucas et al.
patent: 4097159 (1978-06-01), Strandberg
patent: 4097160 (1978-06-01), Yataki et al.
patent: 4149089 (1979-04-01), Idelsohn et al.
patent: 4184175 (1980-01-01), Mullane, Jr.
patent: 4196648 (1980-04-01), Jones et al.
patent: 4199261 (1980-04-01), Tidd et al.
patent: 4274288 (1981-06-01), Tittmann et al.
patent: 4286880 (1981-09-01), Young
patent: 4294149 (1981-10-01), Olsson
patent: 4300836 (1981-11-01), Holmes et al.
patent: 4403294 (1983-09-01), Hamada et al.
patent: 4412746 (1983-11-01), Yokouchi
patent: 4424530 (1984-01-01), Taylor
patent: 4498778 (1985-02-01), White
patent: 4518259 (1985-05-01), Ward
patent: 4606645 (1986-08-01), Matthews et al.
patent: 4800287 (1989-01-01), Green, Sr. et al.
patent: 4801207 (1989-01-01), Williams
patent: 4803371 (1989-02-01), Durland
patent: 4827142 (1989-05-01), Hatje
patent: 4858156 (1989-08-01), Martin
patent: 4879752 (1989-11-01), Aune et al.
patent: 4899356 (1990-02-01), Berry et al.
patent: 4916629 (1990-04-01), Bogue et al.
patent: 4926350 (1990-05-01), Bechtel et al.
patent: 4940850 (1990-07-01), Satake
patent: 4984172 (1991-01-01), Laminari
patent: 4992949 (1991-02-01), Arden
patent: 5023805 (1991-06-01), Aune et al.
patent: 5078496 (1992-01-01), Parker et al.
patent: 5412220 (1995-05-01), Moore
patent: 5703960 (1997-12-01), Soest
acumen Incorporated; 900 Series Programmer's Guide (1991).
Durand-Raute; Durand-Raute Product Bulletin; The Microvision SO-2000 Takes the Guesswork out of Grading no date.
Innovative Vision AB; Brochure; Woodeye; An Automatic Inspection System for Improved Quality and Greater Profits in the Timber Industry no date.
Goulding John R.
Kiest Cary S.
LaChapelle Joseph G.
Bruce David Vernon
Porta David P.
Techne Systems, Inc.
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