4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Absorption

Cary S. Kiest

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Method and apparatus for feature detection in a workpiece

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Method and apparatus for illuminating projecting features on...

Illumination – Work-table lighting system
Reexamination Certificate

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Non-destructive fill volume measurement system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Profile ID: LFUS-PAI-P-1427710

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