Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1998-03-16
2000-07-25
Dutton, Brian
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257209, H01L 2358, H01L 2710
Patent
active
060939338
ABSTRACT:
Logic circuitry formed in street areas between adjacent fabricated electronic devices may be used as auxiliary or redundant components to salvage one or more otherwise defective devices. Logic circuitry is selectively coupled to the defective device(s) to directly replace or facilitate the replacement of defective components on one or more fabricated devices, thereby resulting in a single operable electronic device. The invention may be used to increase the production yield of electronic devices, particularly, semiconductor integrated circuits. The invention permits the fabrication of discretionary wiring during the normal metalization of semiconductor layers to interconnect electronic devices at the same time as the formation of the normal wiring/circuitry of the devices.
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Duesman Kevin G.
Farnworth Warren M.
Wood Alan G.
Dutton Brian
Micro)n Technology, Inc.
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