Method and apparatus for evaluating strains in crystals

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

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250306, 250307, G01N 23203

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049907794

ABSTRACT:
The strains in crystals are evaluated by quantifying the sharpness of an electron channeling pattern and determining changes in the quantified sharpness of the electron channeling pattern. There is such a close correlation between the sharpness of the electron channeling pattern and the strains in crystals that the latter can be evaluated in terms of changes in the former. An apparatus for evaluating strains in crystals comprises a scanning electron microscope having a function to form an electron channeling pattern and an image analyzer having a function to quantify the sharpness of an electron channeling pattern.

REFERENCES:
patent: 3702398 (1972-11-01), Van Essen et al.
patent: 3861199 (1975-01-01), Barkhoudarian
patent: 3866044 (1975-02-01), Grund
patent: 4006357 (1977-02-01), Kanda et al.
patent: 4146788 (1979-03-01), Mirkin et al.
patent: 4160162 (1979-07-01), Muller et al.
patent: 4253154 (1981-02-01), Russ et al.
Kikuchi-like Reflection Patterns obtained with the Scanning Electron Microscope, D. G. Coates, pp. 1179-1184.
Contrast Mechanisms of Special Interest In Materials Science, D. E. Newbury and H. Yakowitz, pp. 149-211.
Deformation Studies At Sliding Wear Tracks In Iron, A. W. Ruff, pp. 59-75.

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