Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-01-11
2010-11-30
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07844928
ABSTRACT:
A test system or simulator includes an IC benchmark software program that executes application software on a semiconductor die IC design model. The benchmark software includes trace, simulation point, clustering and other programs. IC designers utilize the benchmark software to evaluate the performance characteristics of IC designs with customer user software applications. The benchmark software generates basic block vectors BBVs from instruction traces of application software. The benchmark software analyzes data dependent information that it appends to BBVs to create enhanced BBVs or EBBVs. The benchmark software may graph the EBBV information in a cluster diagram and selects a subset of EBBVs as a representative sample for each program phase. Benchmarking software generates a reduced application software program from the representative EBBV samples. Designers use the test system with benchmarking software to evaluate IC design model modifications by using the representative reduced application software program.
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Bell Robert H.
Chen Thomas W.
Eickemeyer Richard J.
Indukuru Venkat R.
Seshadri Pattabi M.
Dimyan Magid Y
International Business Machines - Corporation
Kahler Mark P
Talpis Matt
Whitmore Stacy A
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