Method and apparatus for estimating sampling frequency...

Details Method and apparatus for estimating sampling frequency... Method and apparatus for estimating sampling frequency...

2008-07-15

2011-10-18

Ha, Dac (Department: 2611)

Pulse or digital communications

Synchronizers

Synchronizing the sampling time of digital data

C375S260000, C375S329000

Reexamination Certificate

active

08040990

ABSTRACT:
An apparatus for estimating a sampling frequency offset includes a waveform characteristic extraction unit, a variation quantity calculation unit, and a SFO (sampling frequency offset) estimator. The waveform characteristic extraction unit extracts a waveform characteristic of a training sequence period in one frame period of a sample data signal and outputs a waveform characteristic value corresponding to the waveform characteristic of the training sequence period. The variation quantity calculation unit calculates a waveform characteristic variation quantity representing a variation quantity in waveform characteristic between an m-th frame and an (m−k)-th frame based on a waveform characteristic value in the m-th frame and a waveform characteristic value in the (m−k)-th frame, where m and k are independently integers of 1 or more. The SFO estimator estimates an SFO of the sample data signal based on the waveform characteristic variation quantity.

REFERENCES:
patent: 6839380 (2005-01-01), Ding et al.
patent: 2001/0017902 (2001-08-01), Yamagata et al.
patent: 2005/0084046 (2005-04-01), Seo
patent: 2006/0039507 (2006-02-01), Lee
patent: 2007/0009074 (2007-01-01), Ma
patent: 2008/0025424 (2008-01-01), Yang et al.

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