Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-12-13
2005-12-13
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06976237
ABSTRACT:
Some embodiments of the invention provide a method that computes an estimated distance between an external point and a set of points in the region. This method identifies a characteristic of the set of points. Based on the identified characteristic, the method then identifies a polygon that encloses the set of points. It then identifies a distance between the point and the polygon. Finally, it uses the identified distance to identify the estimated distance.
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Frankle Jonathan
Teig Steven
Cadence Design Systems Inc.
Do Thuan
Stattler Johansen & Adeli LLP
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