Method and apparatus for employing previous test insertion...

Details Method and apparatus for employing previous test insertion... Method and apparatus for employing previous test insertion...

2011-07-19

2011-07-19

Charioui, Mohamed (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S123000, C702S182000

Reexamination Certificate

active

07983871

ABSTRACT:
A method includes determining at least a first characteristic of a device during a first test insertion and storing the first characteristic. The device is identified during a second test insertion. The first characteristic is retrieved responsive to the identification of the device. A test program for the second insertion is configured based on the first characteristic. The configured test program is executed to test the device during the second test insertion.

REFERENCES:
patent: 5475315 (1995-12-01), Cabot
patent: 6202186 (2001-03-01), Oonk
patent: 6543047 (2003-04-01), Vrhel et al.
patent: 6704676 (2004-03-01), Boldt
patent: 6928626 (2005-08-01), McGaughy et al.
patent: 7139956 (2006-11-01), Nozuyama
patent: 7373621 (2008-05-01), Dastidar

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