Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-09-26
2000-09-12
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356376, 356394, 25055934, G01B 1124
Patent
active
061185388
ABSTRACT:
The present invention is a light based detection system for providing a low cost, very fast and very accurate measurements of lead positions and heights for integrated circuit board components. The alignment detections systems of the present invention are preferably located on a component placement head. The detector is a linear or rectangular array of pixels. The light path between the light source and the detector array is directed by the optical components across one or more leads in a plane that is neither parallel to nor perpendicular to the seating plane of the component. The light path is directed across the relevant leads without substantial interference from the body of the component or the other leads not being measured. A digital processor analyzes the measurements of the light sensitive detector to determine positions and/or coplanarity of the leads.
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Case Steven K.
Haugan Carl E.
Jalkio Jeffrey A.
CyberOptics Corporation
Pham Hoa Q.
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