Method and apparatus for differential spectroscopic atomic-imagi

Radiant energy – Inspection of solids or liquids by charged particles

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250307, H01J 3700

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active

049422995

ABSTRACT:
A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.

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patent: 4837435 (1989-06-01), Sakuhara et al.
Abrektsen et al, "A Compact Scanning Tunneling Microscope with Thermal Compensation", J. Phys. E. Sci. Instrum., 22 (1989) 39-42.
J. Stroscio et al., Voltage-Dependent Scanning Tunneling Microscopy Imaging of Semiconductor Surfaces, J. Vac. Sci. Technol., Mar./Apr. 1988, pp. 499-507.
L. Kazmerski, Analysis and Characterization of Thin Films: A Tutorial, Solor Cells, vol. 24, 1988, pp. 387-418.
M. Cardillo, STM Studies of Molecular and Chemical Properties of Surfaces, Physics Today, Jan. 1989, pp. S.20-21.

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