Method and apparatus for diagnosing mass storage device...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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C714S723000

Reexamination Certificate

active

07461298

ABSTRACT:
A type of flaw present in a mass storage device can be inferred by examining the results of I/O operations performed on only a portion of the device, without testing or examining the entire device.

REFERENCES:
patent: 4456995 (1984-06-01), Ryan
patent: 5511164 (1996-04-01), Brunmeier et al.
patent: 5831989 (1998-11-01), Fujisaki
patent: 5835703 (1998-11-01), Konno
patent: 7272758 (2007-09-01), Roohparvar

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