Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1996-01-11
2000-04-04
Kim, Robert H.
Optics: measuring and testing
By polarized light examination
Of surface reflection
356366, 356368, 356 72, G01J 400
Patent
active
060468114
ABSTRACT:
An apparatus for determining electrical conductivity of a surface of an object. The apparatus comprises a first polarizer for polarizing light incident upon the surface of the object. The apparatus also comprises a camera mechanism for receiving the polarized light reflected from the surface of the object and identifying the electrical conductivity of the surface of the object from phase retardance of polarization of the polarized light upon reflection from the surface of the object. The present invention pertains to a method for determining electrical conductivity of a surface of an object. The method comprises the steps of polarizing light. Next there is the step of reflecting the polarized light off the surface of the object. Then there is the step of receiving the reflected polarized light at a camera mechanism. Next there is the step of converting the received polarized light into a corresponding electrical signal with the camera mechanism. Next, there is the step of determining phase retardance of polarization due to the reflection of the polarized light off of the surface of the object. Then, there is the step of identifying the electrical conductivity of the surface of the object from the phase retardance of the polarization of the polarized light reflected off of the surface of the object.
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Chen Hua
Wolff Lawrence B.
Houser Kirk D.
Kim Robert H.
Silverman Arnold B.
The Johns Hopkins University
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