Method and apparatus for determining a proximity correction...

Details Method and apparatus for determining a proximity correction... Method and apparatus for determining a proximity correction...

2006-02-17

2008-03-04

Kik, Phallaka (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

07340713

ABSTRACT:
One embodiment of the present invention provides a system that determines a proximity correction for an integrated circuit layout. During operation, the system receives a layout. Next, the system receives an evaluation point within the layout. The system then determines a visible area associated with the evaluation point. Next, the system determines a proximity correction using the visible area.

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