Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1993-09-01
1994-06-07
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356346, G01B 902
Patent
active
053194411
ABSTRACT:
A laser light, whose wavelength is to be measured, is introduced into an etalon, a concentric circular interference stripe derived from the etalon is irradiated onto a one-dimensional photodetector array and a diameter of the interference stripe is measured to measure the wavelength of the laser light. Alternatively, if a reference laser light of known wavelength is introduced into the etalon, as described above, a wavelength measurement of extremely high accuracy can be made without being affected by positional deviations of the optical system.
REFERENCES:
patent: 4172663 (1979-10-01), Byer et al.
Oeda Yasuo
Ohmata Ken
Shibata Hideaki
Terada Mitsugu
Terashi Yuichiro
Keesee, II LaCharles P.
Mitsui Petrochemical Industries Ltd.
Turner Samuel A.
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