Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-01-23
2007-01-23
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
10914921
ABSTRACT:
A method for detecting nets physically changed and electrically affected by a design ECO includes steps as follows. An ECO is executed on an IC design to produce a post-ECO IC design. A first group of nets of the IC design physically changed by the ECO is identified by comparing a pre-ECO database with a post-ECO database. A pre-ECO design SPEF file of the IC design is parsed with a script to identify a second group of nets in the pre-ECO database based on the first group of nets, the second group of nets being coupled to the first group of nets. The second group of nets is pre-ECO electrically affected nets. Parasitics for the first group of nets in the post-ECO database are extracted to generate a parasitic data file for the first group of nets. The parasitic data file is parsed with the script to identify a third group of nets in the post-ECO database based on the first group of nets, the third group of nets being coupled to the first group of nets. The third group of nets is post-ECO electrically affected nets. Finally, a file listing the first group of nets, the second group of nets and the third group of nets is generated.
REFERENCES:
patent: 6360350 (2002-03-01), Gabele et al.
patent: 6463574 (2002-10-01), Culetu et al.
patent: 6530073 (2003-03-01), Morgan
patent: 6601222 (2003-07-01), Mehrotra et al.
patent: 6631510 (2003-10-01), Betz et al.
Hoff Jason
Prevedel Daniel
Do Thuan
LSI Logic Corporation
Suiter-Swantz PC LLO
Tat Binh
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