Method and apparatus for detecting and analyzing the...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

10410919

ABSTRACT:
One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.

REFERENCES:
patent: 6493853 (2002-12-01), Savithri et al.
patent: 6807659 (2004-10-01), Alpert et al.
patent: 6826736 (2004-11-01), Wu et al.
patent: 6836873 (2004-12-01), Tseng et al.
patent: 6853322 (2005-02-01), Dedic
patent: 6990647 (2006-01-01), Tseng
patent: 7007252 (2006-02-01), Gyure et al.
patent: 2002/0188577 (2002-12-01), Vidhani et al.
patent: 2003/0079191 (2003-04-01), Savithri et al.
patent: 2003/0145296 (2003-07-01), Chandra et al.
patent: 2003/0229481 (2003-12-01), Wu et al.
“Dynamic CMOC Noise Immunity”, pp. 41-44, Microelectronics, 1998. ICM '98. Proceedings of the Tenth International Conference on, A. Kabbani and A.J. Al-Khalili.
P. R. Tadikamalla et al., Sampling from the Weibull and Gamma Distributions in GPSS, ACM SIGSIM Simulation Digest, vol. 9, Issue 1, pp. 39-45, Fall-Winter 1977.
A. Kasnavi et al., Analytical Modeling of Crosstalk Noise Waveforms using Weibull Function, International Conference on Computer Aided Design, pp. 141-146, 2004.
P.R. Tadikamalla et al., Sampling from the Weibull and Gamma Distributions in GPSS, ACM SIGSIM Simulation Digest, vol. 9, Issue 1, pp. 39-45, Fall-Winter 1977.

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