Method and apparatus for cutting devices from substrates

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S033000, C438S113000, C438S460000

Reexamination Certificate

active

07112518

ABSTRACT:
A method and system for cutting a wafer comprising a semiconductor substrate attached to an array of integrated devices includes placing the wafer on a stage such as a movable X-Y stage including a vacuum chuck having a porous mounting surface, and securing the wafer during and after cutting by vacuum pressure through the pores. The wafer is cut by directing UV pulses of laser energy at the substrate using a solid-state laser having controlled polarization. An adhesive membrane can be attached to the separated die to remove them from the mounting surface, or the die can otherwise be removed after cutting from the wafer.

REFERENCES:
patent: 3626141 (1971-12-01), Daly
patent: 3814895 (1974-06-01), Fredricksen
patent: 3816700 (1974-06-01), Weiner et al.
patent: 4237601 (1980-12-01), Woolhouse et al.
patent: 4336439 (1982-06-01), Sasnett et al.
patent: 4543464 (1985-09-01), Takeuchi
patent: 4562333 (1985-12-01), Taub et al.
patent: 4664739 (1987-05-01), Aurichio
patent: 4906011 (1990-03-01), Hiyamizu et al.
patent: 4921564 (1990-05-01), Moore
patent: 5057664 (1991-10-01), Johnson et al.
patent: RE33947 (1992-06-01), Shinohara
patent: 5138131 (1992-08-01), Nishikawa et al.
patent: 5324012 (1994-06-01), Aoyama et al.
patent: 5387776 (1995-02-01), Preiser
patent: 5611946 (1997-03-01), Leong et al.
patent: 5626777 (1997-05-01), Hugl et al.
patent: 5627109 (1997-05-01), Sassa et al.
patent: 5703713 (1997-12-01), Leong et al.
patent: 5801356 (1998-09-01), Richman
patent: 5809987 (1998-09-01), Wark et al.
patent: 5811751 (1998-09-01), Leong et al.
patent: 5961852 (1999-10-01), Rafla-Yuan et al.
patent: 5963364 (1999-10-01), Leong et al.
patent: 5987920 (1999-11-01), Bosman et al.
patent: 5994205 (1999-11-01), Yamamoto et al.
patent: 6057525 (2000-05-01), Chang et al.
patent: 6107162 (2000-08-01), Morita et al.
patent: 6121118 (2000-09-01), Jin et al.
patent: 6126520 (2000-10-01), Jochim-Schmidt et al.
patent: 6130401 (2000-10-01), Yoo et al.
patent: 6182733 (2001-02-01), McReynolds
patent: 6365429 (2002-04-01), Kneissl et al.
patent: 6413839 (2002-07-01), Brown et al.
patent: 6509546 (2003-01-01), Egitto et al.
patent: 6514339 (2003-02-01), Jung
patent: 6580054 (2003-06-01), Liu et al.
patent: 6757314 (2004-06-01), Kneissl et al.
patent: 2002/0031899 (2002-03-01), Manor
patent: 2002/0125232 (2002-09-01), Choo et al.
patent: 2003/0209528 (2003-11-01), Choo et al.
patent: 1137072 (2001-09-01), None
patent: 53-025996 (1978-03-01), None
patent: 55151351 (1980-11-01), None
patent: 56006451 (1981-01-01), None
patent: 57066650 (1982-04-01), None
patent: 57081985 (1982-05-01), None
patent: 58044738 (1983-03-01), None
patent: 58044739 (1983-03-01), None
patent: 58068946 (1983-04-01), None
patent: H04298063 (1992-10-01), None
patent: H05144939 (1993-06-01), None
patent: H07240453 (1995-09-01), None
patent: H09022935 (1997-01-01), None
patent: 10064854 (1998-03-01), None
patent: H10116801 (1998-05-01), None
patent: H10138200 (1998-05-01), None
patent: 10-190117 (1998-07-01), None
patent: H10209085 (1998-08-01), None
patent: S63210148 (1998-08-01), None
patent: H11097742 (1999-04-01), None
patent: H11126763 (1999-05-01), None
patent: 11-224865 (1999-08-01), None
patent: 11224866 (1999-08-01), None
patent: 11-267867 (1999-10-01), None
patent: 2000004066 (2000-01-01), None
patent: 2000-0161677 (2000-02-01), None
patent: 2000-156358 (2000-06-01), None
patent: 2000196186 (2000-07-01), None
patent: 2001-170786 (2001-06-01), None
patent: 2001196332 (2001-07-01), None
patent: WO 00/75983 (2000-12-01), None
Lee, J.M., et al., “Scribing and cutting a blue LED wafer using a Q-switched Nd:YAG laser,” Appl. Phys. A 70, 561-564 (2000).
Veiko, V.L., et al., “Laser Technology and Micro Electronics,” Publishing House of the Bulgarian Academy of Sciences, 1991. 12 pages. (Chinese translation of the original Russian and English translation of the Chinese translation.).
Hung-Lung Chen et al. “Laser Successfully Cuts Sapphire Substrate” Optical Communication No. 93, Dec. 2001, pp. 37-40 (Chinese language document accompanied by English translation which consists of 9 pages).
Wu Guoan et al. “Laser Processes and Microelectronic Technology” National Defense Industry Press, Beijing, China Jul. 1997, 12 pages (Chinese language document accompanied by English translation which consists of 12 pages).
“Porous Tungsten & Molybdenum,” available at http://www.spectramat.com/pormotun.html.
Soilmoisture Equipment Corp., Catalog, available at http://www.soilmoisture.com/ceramics.html.
Soilmoisture, “Porous Ceramics Catalog,” available at http://www.soilmoisture.com.
Spectra-Physics Business Units: Products “Navigator II” (Oct. 7, 2002), 2 pages, see http://www.splasers.com/products/oem—products/fcb—yhb—series.html.
Spectra-Physics: Products “Navigator I” (Oct. 7, 2002), 2 pages, see http://www.splasers.com/products/oem—Products
avigator1.html.
Furukawa Electric, “What is UV-Tapes?” (May 23, 2002), 2 pages, see http://www.furukawa.co.jp/uvtape/en/whatis.htm.
Furukawa Electric product brochure, “UV-Tapes for Semiconductor Processing” 8 pages.
Ostendorf, A. et al. “Material Processing Applications for Diode Pumped Solid State Lasers,” Lambda Highlights 57, Lambda Physik Pub. (May 2000), 8 pages.
Villeneuve, Tim, “Nanosecond Pulsed Lasers Improve Micro-Machining” ESIGNNEWS Semiconductor Manufacturing (Jun. 4, 2001) 33-35.
Masahiro Nakamura, “LD-Pumped Solid-State UV Laser Oscillator by Quantum Design Japan, Inc.”, Electronic Journal, vol. 92, pp. 194-195, Nov. 15, 2001.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for cutting devices from substrates does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for cutting devices from substrates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for cutting devices from substrates will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3562136

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.