Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-04-12
2005-04-12
Whitmore, Stacy A. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06880138
ABSTRACT:
The present invention introduces novel methods of generating input vectors for machine learning system that will perform extraction. Experimental design is employed to select a set of training points that provide the best information. In one embodiment, a set of input vectors and output vectors are analyzed to determine a set of critical input parameters. Then, a spanning point generation program is used to generate a set of spanning points that cover the identified critical input space. The training point set then used to train a machine learning model.
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Chatterjee Arindam
Teig Steven
Cadence Design Systems Inc.
Dimyan Magid Y.
Stattler Johansen & Adeli LLP
Whitmore Stacy A.
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