Method and apparatus for controlling a memory array with a...

Static information storage and retrieval – Systems using particular element – Flip-flop

Reexamination Certificate

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C365S233100, C365S230080, C365S230090

Reexamination Certificate

active

06327175

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates to the field of semiconductor memory devices and, in particular, to a memory device that combines the features of a synchronous and an asynchronous static random access memory (SRAM) in a single integrated circuit.
BACKGROUND
For over a decade, SRAMs have been used in a variety of applications, especially low power applications and small system applications where the higher cost of such devices (e.g., as compared to DRAMs) is offset by simpler and less expensive system design. To date however, system designers have been forced to choose between using asynchronous SRAMs and synchronous SRAMs. Thus, circuit board layouts (e.g., pin out patterns) have been unique for synchronous SRAMs and asynchronous SRAMs.
FIG. 1
illustrates the main features of a synchronous SRAM
10
. As shown, various inputs to the device are provided to associated input registers, which operate under the control of a common clock signal (e.g., a system clock signal provided to other components in the system within which the memory is located) and/or a control signal (not shown). For example, signals from an address bus
12
are usually latched in address registers
14
. Likewise, data signals from a data bus
16
are latched in data registers
18
. Some synchronous SRAMs also latch a read/write control signal
20
in a write enable register
22
. Usually, the input registers
14
,
18
and
22
operate under the control of an internal clock signal
24
, provided by clock input circuitry
26
, which receives the system clock (Clk)
28
.
Address signals
30
from the address registers
14
are usually provided to row decoders
32
and column decoders
34
. Often, the column decoders are associated with input/output (I/O circuitry (e.g., sense amplifiers and associated drivers) to access memory cells in the memory array
36
. During a write, data signals
38
from the data registers
18
are provided to the column I/O circuits
34
through buffers
40
that are operated under the control of an internal write pulse
42
. The internal write pulse
42
is usually generated by a combination of internal signals, for example the internal clock signal
24
and an internal write signal
44
from the write enable register
22
. For a read, data signals
46
are provided from the I/O circuits
34
to output registers and buffers
48
that operate under the control of the internal clock signal
24
and an output signal
50
. The output signal
50
is usually provided by an output enable buffer
52
, which is used to receive the output enable signal
54
provided to the memory device (e.g., from a microprocessor or other memory control device). The output buffers
48
drive an output data bus
56
.
Conventional synchronous SRAMs may also include burst control circuitry
58
, which is used when burst operations are performed. During burst operations, multiple words may be read from the memory device
10
, even though only a single address input is provided on the address bus
12
. This is usually accomplished by providing a control signal (not shown) that indicates a burst operation is to be performed, along with the starting address for the operation. Data from that address is read out, followed by additional reads from other addresses. The information needed to generate the other addresses is provided to the row and column decoders by the burst control circuitry
58
, which usually increments the starting address by some fixed value or values to generate the subsequent address information. The value(s) of the subsequent address(es) may depend on the type of burst operation being implemented, for example a linear sequential burst or an interleaved burst.
One important difference between synchronous SRAMs and asynchronous SRAMs is the use of a clock signal (Clk) to control the operations within the memory device. While the synchronous SRAM relies on such a signal, as shown in
FIG. 2
, the asynchronous SRAM does not. Instead, asynchronous SRAMs, such as asynchronous SRAM
100
, operate independently of a system clock. Thus, address signals
102
from an address bus
102
are provided directly to row and column decoders
104
and
106
. Again, the column decoders
106
may be associated with I/O circuitry (sense amplifiers and drivers, etc.) to allow for read and write operations. Thus, signals from a data bus
108
and a control bus
110
may be provided to the I/O circuits
106
to control these read and write operations. During a read, data signal from the array
112
are provided through the I/O circuitry
106
to output buffers
114
, which also may be operated under the control of signals from the control bus
110
, to ultimately provide data out signals
116
. For a write, data signals from the data bus
108
are driven to memory cells of the array
106
specified by the address signals on address bus
102
, through the I/O circuits
106
.
Because the asynchronous SRAM
100
does not operate under the control of a system clock, designers must take care to ensure that any devices reading from and/or writing to the memory operate with compatible bus cycles. Further, because conventional asynchronous SRAMs typically do not operate in a burst mode, each read operation must typically be associated with a separate read address provided on address bus
102
.
Synchronous and asynchronous SRAMs each have associated benefits and drawbacks, making each type of device better suited to some applications than others. For example, high performance systems that require memories to operate without skews often require the use of synchronous SRAMs. However, to date no single SRAM device (i.e., no single integrated circuit) has offered the option of choosing a synchronous or asynchronous mode of operation.
SUMMARY OF THE INVENTION
In one embodiment, a memory device (e.g., an SRAM) that is configurable to be operated in an asynchronous or a synchronous mode in accordance with a value stored in a control register thereof is provided. In addition to asynchronous and synchronous operating modes, additional features such burst mode operations, including asynchronous burst mode operations and/or synchronous burst mode operations (e.g., linear sequential and/or interleaved burst operations), are configurable in accordance with additional values stored in the control register. Also, the number of pipeline stages of an output path of the SRAM may be configured in accordance with additional values stored in the control register.
7
. So too may the number of data hold cycles for synchronous operation of the SRAM be likewise configured.
In another embodiment, an SRAM that includes a control register configurable to determine an operational mode (e.g., synchronous or asynchronous operation) thereof is provided. In some cases, the control register may include storage locations for control bits to determine a type of burst mode (including linear sequential, interleaved and asynchronous burst modes); a number of output pipeline stages; and/or a number of data hold cycles for various operations of the SRAM.
Still further embodiments provide for operating a memory device (e.g., an SRAM) in a synchronous or an asynchronous mode, according to a control bit stored in a control register thereof. One of a number of available burst modes (including an asynchronous burst mode) and/or additional operating features may also be selected according to additional control bits stored in the control register.


REFERENCES:
patent: 5386385 (1995-01-01), Stephens, Jr.
patent: 5617555 (1997-04-01), Patel et al.
patent: 5634139 (1997-05-01), Takita
patent: 5793693 (1998-08-01), Collins et al.
patent: 5923615 (1999-07-01), Leach et al.
patent: 5953285 (1999-09-01), Churchill et al.
patent: 6026465 (2000-02-01), Mills et al.
patent: 6088760 (2000-07-01), Walker et al.

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