Static information storage and retrieval – Powering
Reexamination Certificate
2006-03-21
2006-03-21
Dinh, Son T. (Department: 2824)
Static information storage and retrieval
Powering
C365S201000, C327S374000
Reexamination Certificate
active
07016248
ABSTRACT:
The invention relates to a method and apparatus for controlling a high voltage generator during wafer burn-in. The method includes generating an enable signal for enabling a high voltage generator responsive to a mode signal, e.g., a wafer bum-in test mode. The method provides an external voltage to a semiconductor memory device through a pad responsive to the enable signal. The method varies a high voltage level being output from the high voltage generator in response to a reference voltage level.
REFERENCES:
patent: 5424990 (1995-06-01), Ohsawa
patent: 5754418 (1998-05-01), Park et al.
patent: 5796287 (1998-08-01), Furutani et al.
patent: 6372528 (2002-04-01), Yamamoto
Choi Jong-Hyun
Jung Yong-Hwan
Kang Sang-Seok
Kim Hyung-Dong
Park Choong-Sun
Dinh Son T.
Marger & Johnson & McCollom, P.C.
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