Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-03-27
2007-03-27
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
11077239
ABSTRACT:
One embodiment of the present invention provides a system that estimates the equivalent capacitances for a set of conductors within an electrical structure. During operation, the system constructs a Gaussian surface that encloses a first conductor, but does not contain any other conductor. The system then computes the equivalent capacitance by constructing a sequence of locations within the electric structure, wherein the first location in the sequence is on the Gaussian surface, and the last location in the sequence is on a second conductor in the set of conductors. Specifically, if a location in the sequence of locations is on the surface of a neighboring conductor that is not in the set of conductors, the system can select the next location in the sequence of locations on a neighboring Gaussian surface that encloses the neighboring conductor, but does not contain any other conductor. Note that, by selecting the next location in the sequence of locations on a neighboring Gaussian surface, the system can quickly reach the second conductor, thereby quickly estimating the equivalent capacitance by reducing the computational time required to construct the sequence of locations.
REFERENCES:
patent: 6826517 (2004-11-01), Okada
patent: 7124069 (2006-10-01), Meuris et al.
patent: 2006/0053394 (2006-03-01), Batterywala et al.
Dinh Paul
Park Vaughan & Fleming LLP
Synopsys Inc.
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