Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2003-10-07
2009-06-02
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C327S512000, C327S540000, C323S313000, C323S315000
Reexamination Certificate
active
07543253
ABSTRACT:
The present invention provides a method and apparatus for compensating for temperature effects in the operation of semiconductor processes circuitry, such as reference circuits. The method operates on the realization that the second order effects such as “curvature” in the reference voltage variation over a temperature range is removed. The reference voltage variation over a temperature range can be represented as a straight line. This method provides for the trimming of the absolute voltage by scaling the reference voltage at a first temperature to the desired value by a temperature independent voltage. Then, at a second temperature, the output voltage slope is corrected by adding or subtracting a voltage which is always zero at the first temperature.
REFERENCES:
patent: 4399398 (1983-08-01), Wittlinger
patent: 4475103 (1984-10-01), Brokaw et al.
patent: 4603291 (1986-07-01), Nelson
patent: 4714872 (1987-12-01), Traa
patent: 4808908 (1989-02-01), Lewis et al.
patent: 4939442 (1990-07-01), Carvajal et al.
patent: 5053640 (1991-10-01), Yum
patent: 5119015 (1992-06-01), Watanabe
patent: 5229711 (1993-07-01), Inoue
patent: 5325045 (1994-06-01), Sundby
patent: 5352973 (1994-10-01), Audy
patent: 5424628 (1995-06-01), Nguyen
patent: 5512817 (1996-04-01), Nagaraj
patent: 5563504 (1996-10-01), Gilbert et al.
patent: 5646518 (1997-07-01), Lakshmikumar et al.
patent: 5821807 (1998-10-01), Brooks
patent: 5828329 (1998-10-01), Burns
patent: 5933045 (1999-08-01), Audy et al.
patent: 5952873 (1999-09-01), Rincon-Mora
patent: 5982201 (1999-11-01), Brokaw et al.
patent: 6002293 (1999-12-01), Brokaw
patent: 6075354 (2000-06-01), Smith et al.
patent: 6157245 (2000-12-01), Rincon-Mora
patent: 6218822 (2001-04-01), MacQuigg
patent: 6225796 (2001-05-01), Nguyen
patent: 6255807 (2001-07-01), Doorenbos et al.
patent: 6329804 (2001-12-01), Mercer
patent: 6329868 (2001-12-01), Furman
patent: 6356161 (2002-03-01), Nolan et al.
patent: 6373330 (2002-04-01), Holloway
patent: 6426669 (2002-07-01), Friedman et al.
patent: 6462625 (2002-10-01), Kim
patent: 6483372 (2002-11-01), Bowers
patent: 6489787 (2002-12-01), McFadden
patent: 6489835 (2002-12-01), Yu et al.
patent: 6501256 (2002-12-01), Jaussi et al.
patent: 6529066 (2003-03-01), Guenot et al.
patent: 6531857 (2003-03-01), Ju
patent: 6590372 (2003-07-01), Wiles, Jr.
patent: 6614209 (2003-09-01), Gregoire, Jr.
patent: 6642699 (2003-11-01), Gregoire
patent: 6661713 (2003-12-01), Kuo
patent: 6664847 (2003-12-01), Ye
patent: 6690228 (2004-02-01), Chen et al.
patent: 6791307 (2004-09-01), Harrison
patent: 6798286 (2004-09-01), Dauphinee et al.
patent: 6828847 (2004-12-01), Marinca
patent: 6836160 (2004-12-01), Li
patent: 6853238 (2005-02-01), Dempsey et al.
patent: 6885178 (2005-04-01), Marinca
patent: 6891358 (2005-05-01), Marinca
patent: 6894544 (2005-05-01), Gubbins
patent: 6919753 (2005-07-01), Wang et al.
patent: 6930538 (2005-08-01), Chatal
patent: 6958643 (2005-10-01), Rosenthal
patent: 6987416 (2006-01-01), Ker et al.
patent: 6992533 (2006-01-01), Hollinger et al.
patent: 7012416 (2006-03-01), Marinca
patent: 7057444 (2006-06-01), Illegems
patent: 7068100 (2006-06-01), Dauphinee et al.
patent: 7088085 (2006-08-01), Marinca
patent: 7091761 (2006-08-01), Stark et al.
patent: 7112948 (2006-09-01), Daly et al.
patent: 7170336 (2007-01-01), Hsu
patent: 7173407 (2007-02-01), Marinca
patent: 7193454 (2007-03-01), Marinca
patent: 7199646 (2007-04-01), Zupcau et al.
patent: 7211993 (2007-05-01), Marinca
patent: 7224210 (2007-05-01), Garlapati et al.
patent: 7236047 (2007-06-01), Tachibana et al.
patent: 7248098 (2007-07-01), Teo
patent: 7260377 (2007-08-01), Burns et al.
patent: 7301321 (2007-11-01), Uang et al.
patent: 7372244 (2008-05-01), Marinca
patent: 7411380 (2008-08-01), Chang et al.
patent: 7472030 (2008-12-01), Scheuerlein
patent: 7482798 (2009-01-01), Han
patent: 2003/0234638 (2003-12-01), Eshraghi et al.
patent: 2005/0194957 (2005-09-01), Brokaw
patent: 2005/0237045 (2005-10-01), Lee et al.
patent: 2006/0017457 (2006-01-01), Pan et al.
patent: 2006/0038608 (2006-02-01), Ozawa
patent: 2008/0018319 (2008-01-01), Chang et al.
patent: 2008/0074172 (2008-03-01), Marinca
patent: 2008/0224759 (2008-09-01), Marinca
patent: 2008/0265860 (2008-10-01), Dempsey et al.
patent: 0510530 (1992-10-01), None
patent: 1359490 (2003-11-01), None
patent: 1359490 (2003-11-01), None
patent: 4-167010 (1992-06-01), None
patent: 0115143 (2007-12-01), None
Zeng et al., “CMOS digital integrated temperature sensor”, Oct. 24-27, 2005, ASIC, 2005, ASICON 2005. 6th International Conference On, vol. 1, pp. 248-252.
PCT/EP2008/058685 International Search Report and written opinion, Oct. 1, 2008.
PCT/EP2008/051161 International Search Report and written opinion, May 16, 2008.
Chen, Wai-Kai, “The circuits and filters handbook”, 2nd ed, CRC Press, 2003.
Cressler, John D., “Silicon Heterostructure Handbook”, CRC Press-Taylor & Francis Group, 2006; 4.4-427-438.
Banba et al, “A CMOS bandgap reference circuit with Sub-1-V operation”, IEEE JSSC vol. 34, No. 5, May 1999, pp. 670-674.
Brokaw, A. Paul, “A simple three-terminal IC bandgap reference”, IEEE Journal of Solid-State Circuits, vol. SC-9, No. 6, Dec. 1974, pp. 388-393.
Jones, D.A., and Martin, K., “Analog Integrated Circuit Design”, John Wiley & Sons, USA, 1997 (ISBN 0-47L-L4448-7, pp. 353-363).
Malcovati et al, “Curvature-compensated BiCMOS bandgap with 1-V supply voltage”, IEEE JSSC, vol. 36, No. 7, Jul. 2001.
Sudha et al, “A low noise sub-bandgap voltage reference”, IEEE, Proceedings of the 40th Midwest Symposium on Circuits and Systems, 1997. vol. 1, Aug. 3-6, 1997, pp. 193-196.
Widlar, Robert J., “New developments in IC voltage regulators”, IEEE Journal of Solid-State Circuits, vol. SC-6, No. 1, Feb. 1971, pp. 2-7.
Gray, Paul R., et al,Analysis and Design of Analog Integrated Circuits, Chapter 4, 4th ed., John Wiley & Sons, Inc., 2001, pp. 253-327.
PCT/EP2005/052737 International Search Report, Sep. 23, 2005.
PCT/EP2008/067402 International Search Report, Mar. 20, 2009.
Marinca Stefan
O'Dwyer Thomas G.
Analog Devices Inc.
Rossoshek Helen
Wolf Greenfield & Sacks P.C.
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