Electrical computers and digital processing systems: support – Clock – pulse – or timing signal generation or analysis
Reexamination Certificate
2006-01-03
2006-01-03
Butler, Dennis M. (Department: 2115)
Electrical computers and digital processing systems: support
Clock, pulse, or timing signal generation or analysis
C713S503000
Reexamination Certificate
active
06983394
ABSTRACT:
Method and apparatus for providing a measure of jitter and skew of a clock signal is described. The clock signal may be used as an input to a digital circuit. In one embodiment, a digital delay circuit is used in conjunction with a processing circuit to continuously measure the jitter of an input clock signal, thus providing clock signal performance measurement over time. In another embodiment, a pair of digital delay circuits are used to continuously measure the skew or delay between a reference clock signal and a input clock signal, thus providing a measurement of the skew of the input clock signal over time. The digital delay circuit(s) are formed on-chip, and thus an on-chip determination of jitter or skew may be provided.
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Logue John D.
Morrison Shawn K.
Percey Andrew K.
Sawyer Nicholas J.
Simkins James M.
Butler Dennis M.
Webostad W. Eric
Xilinx , Inc.
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