Method and apparatus for cleaning semiconductor wafers using...

Cleaning and liquid contact with solids – Apparatus – With plural means for supplying or applying different fluids...

Reexamination Certificate

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C134S100100, C134S102100, C134S137000, C134S142000, C134S157000, C134S099100, C134S902000, C156S345510, C156S345550

Reexamination Certificate

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07568490

ABSTRACT:
An apparatus and method are disclosed in which a semiconductor substrate having a surface containing contaminants is cleaned or otherwise subjected to chemical treatment using a foam. The semiconductor wafer is supported either on a stiff support (or a layer of foam) and foam is provided on the opposite surface of the semiconductor wafer while the semiconductor wafer is supported. The foam contacting the semiconductor wafer is pressurized using a form to produce a jammed foam. Relative movement between the form and the semiconductor wafer, such as oscillation parallel and/or perpendicular to the top surface of the semiconductor wafer, is then induced while the jammed foam is in contact with the semiconductor wafer to remove the undesired contaminants and/or otherwise chemically treat the surface of the semiconductor wafer using the foam.

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International Search Report from corresponding International Patent Application No. PCT/US2004/042831, mailed May 27, 2005.

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