Method and apparatus for cleaning deposited films from the...

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With mechanical mask – shield or shutter for shielding workpiece

Reexamination Certificate

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C156S345330, C156S345510, C118S728000, C216S067000, C438S710000, C438S714000

Reexamination Certificate

active

06837967

ABSTRACT:
A plasma edge cleaning apparatus is configured to remove film deposits from a wafer edge. A gas distribution manifold is annular shaped and positioned to provide plasma process gases near the edge of the wafer. A top insulator and a wafer support each include a magnetic coil to generate a magnetic field for shielding the selected portions of a wafer from the generated plasma. The top insulator is positioned above the wafer during edge processing so as to form a small gap between the top insulator and the wafer to prevent plasma from etching active die areas of the wafer.

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patent: 5246532 (1993-09-01), Ishida
patent: 6364957 (2002-04-01), Schneider et al.
patent: 6676760 (2004-01-01), Kholodenko et al.
patent: 61000577 (1986-01-01), None
patent: 62128538 (1987-06-01), None
patent: 62287072 (1987-12-01), None
patent: 01230766 (1989-09-01), None
patent: 03297124 (1991-12-01), None

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