Method and apparatus for characteristics impedance...

Details Method and apparatus for characteristics impedance... Method and apparatus for characteristics impedance...

2008-04-15

2008-04-15

Garbowski, Leigh M. (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

07360188

ABSTRACT:
A method and apparatus are provided for implementing characteristic impedance discontinuity reduction in customized high-speed flexible circuit applications. A curved artwork region is selected and selected cells are scanned. An area on opposite sides of a signal wire within each cell is determined. The identified areas are compared using a user defined delta value. If the compared areas differ greater than the user defined delta value, then a coordinate change is computed for moving the signal wire to reduce characteristic impedance discontinuity.

REFERENCES:
patent: 6532439 (2001-10-01), Anderson et al.
patent: 6845492 (2005-01-01), Frank et al.
patent: 2005/0246669 (2005-11-01), Yamazaki

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