Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2006-08-29
2006-08-29
Lindsay, Jr., Walter L. (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
C438S016000, C438S017000
Reexamination Certificate
active
07098048
ABSTRACT:
A method includes receiving a fault notification message associated with a fault condition in a manufacturing system. Workpiece identification information is determined for at least one workpiece associated with the fault condition based on the fault notification message. Fault state data is collected based on the workpiece identification information. A fault record including the workpiece identification information and the fault state data is stored. A manufacturing system includes a plurality of tools for processing workpieces, a fault database, and a fault monitor. The fault monitor is configured to receive a fault notification message associated with a fault condition in the manufacturing system, determine workpiece identification information for at least one of the workpieces associated with the fault condition based on the fault notification message, collect fault state data based on the workpiece identification information, and store a fault record including the workpiece identification information and the fault state data in the fault database.
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Advanced Micro Devices , Inc.
Lindsay Jr. Walter L.
Williams Morgan & Amerson
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