4. Data processing: generic control systems or specific application
  5. Generic control system, apparatus or process
  6. Optimization or adaptive control

Anastasia O. Peterson

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Method and apparatus for capturing fault state data

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Selecting control algorithms based on business rules

Data processing: generic control systems or specific application – Generic control system – apparatus or process – Optimization or adaptive control
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2806310

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