Method and apparatus for calibrating a particle emissions monito

Details Method and apparatus for calibrating a particle emissions monito Method and apparatus for calibrating a particle emissions monito

1996-01-11

1998-07-07

Hantis, K.

Optics: measuring and testing

By particle light scattering

With photocell detection

2502521R, G01N 2100

Patent

active

057777349

ABSTRACT:
The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.

REFERENCES:
patent: 5369035 (1994-11-01), Eastgate et al.
patent: 5526110 (1996-06-01), Braymen

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