Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-01-12
2010-12-28
Lin, Sun J (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07861194
ABSTRACT:
A diagonal-capacitance calculating unit calculates diagonal capacitance based on the adjacent wirings in diagonally upward and downward direction from a target wiring. A basic-capacitance correcting unit corrects basic capacitance, which is wiring capacitance based on adjacent wirings in above, below, on a left of, and on a right of the target wiring, based on the adjacent wirings in diagonally upward and downward direction from the target wiring. A total-capacitance calculating unit adds up the diagonal capacitance calculated and the basic capacitance corrected, to calculate wiring capacitance of the target wiring.
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Peter Habitz et al., “IBM ASICs Redefine Performance Standard for Parasitic Extraction”,IBM Microelectronics, vol. 7, No. 4, Fourth Quarter 2001.
Communication mailed from the Japanese Patent Office on Nov. 10, 2009 in the corresponding Japanese patent application No. 2004-254576.
Concise explanation of references AG (JP 2002-299456) and AH (JP 2004-38395) cited herein.
Fujitsu Limited
Lin Sun J
Memula Suresh
Staas & Halsey , LLP
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