Electronic digital logic circuitry – Multifunctional or programmable – Having details of setting or programming of interconnections...
Reexamination Certificate
2005-03-01
2005-03-01
Chang, Daniel D. (Department: 2819)
Electronic digital logic circuitry
Multifunctional or programmable
Having details of setting or programming of interconnections...
C326S016000, C326S046000, C714S726000
Reexamination Certificate
active
06861867
ABSTRACT:
A system for remotely/automatedly testing an ASIC and particularly to testing a user-designed circuit is disclosed. In general, a system in accordance with the invention includes a plurality of cells, where the cells are couplable to form a user-designed circuit, e.g., by customizing routing. Within the ASIC and prior to any knowledge of the user-designed circuit, the ASIC includes circuitry to enable internal remote/automated testing of the user-designed circuit to be later formed. The circuitry controls the input and mode of operation of the cells and the sequencing of multiple synchronous or asynchronous clock domain inputs thereby providing testing of the user-designed circuit at speed for stuck-at-faults and delay faults.
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Vermeulen B et al. “Test and dabug strategy of the PNX8525 Naxperiadigital video platform system chip” Proceedings International Test Conference 2001, ITC 2001.Baltimore, MD. Oct. 30-Nov. 1, 2001, International Test Conference, New York, NY: IEEE, US, Oct. 30, 2001, pp 121-130, XP002237599 ISBN: 0-7803-7169-0 paragraph '00041.
Mukund Shridhar
West Eric
Chang Daniel D.
Haynes Beffel & Wolfeld LLP
Lightspeed Semiconductor Corporation
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