Method and apparatus for built-in self test of integrated circui

Details Method and apparatus for built-in self test of integrated circui Method and apparatus for built-in self test of integrated circui

1997-08-21

2000-01-04

Yoo, Do Hyun

Static information storage and retrieval

Addressing

Sync/clocking

36518907, 36523003, 36523009, 365239, G11C 700

Patent

active

060117486

ABSTRACT:
A BIST function is provided in which both the row address and the column address of a memory to be tested may be selected independently. The present invention provides flexibility in selecting addresses to be tested, improves transition time between rows, and allows determination of which memory address passes or fails the test.

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