Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-06-06
2006-06-06
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C716S030000
Reexamination Certificate
active
07058534
ABSTRACT:
Method and apparatus for application specific testing of PLDs. The PLD has a number of resources, less than all of which are used for implementing a customer application. The method includes the following steps. The set of resources that is used for implementing the customer application is identified. A test is then performed only on the set and a test result is generated. Defective resources may be replaced. The PLD is identified as defective only if one of the resources associated with the customer application is defective. Such application specific testing allows the ability of the customer to perform in-system testing, the reduction of the time required for testing the PLD, and the testing of PLDs based on knowledge of the customer's application, among other advantages.
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Dastidar Jayabrata Ghosh
Harms Michael
Perry Steven
Tracy Paul
Altera Corporation
Charioui Mohamed
Hoff Marc S.
Townsend and Townsend / and Crew LLP
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