Method and apparatus for analyzing positron extinction and elect

Details Method and apparatus for analyzing positron extinction and elect Method and apparatus for analyzing positron extinction and elect

1986-06-04

1988-04-26

Anderson, Bruce C.

Radiant energy

Inspection of solids or liquids by charged particles

250307, 250399, G01N 2300

Patent

active

047406941

ABSTRACT:
This invention relates to a method and apparatus for positron extinction analysis which irradiates a positron beam to a sample to be analyzed through a convergent lens system consisting of a magnetic lens and measures the extinction .gamma.-rays generated from the sample for the positron extinction analysis. The invention utilizes the property of the magnetic lens of an electron microscope that the magnetic lens has the same focal distance for both the positron and the electron having mutually the same energy. If the magnetic lens of the electron microscope is used as a convergent lens system for a positron beam, the positron beam can be radiated highly accurately to a very small, local position of the sample which is being observed through the electron microscope. For instance, in the case of a transmission type electron microscope, the convergent lens system of the electron beam is used as a convergent lens system of the positron beam.

REFERENCES:
patent: 2582981 (1952-01-01), Fua
patent: 4064438 (1977-12-01), Alex et al.
patent: 4463263 (1984-07-01), Padawer
"Point Defects and Radiation Effects in B.C.C. Metals", Frank; Proceedings of the Yamada Conference V in Kyota, Japan, Nov. 16-20, 1981, pp. 203-208.

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