Dynamic information storage or retrieval – Condition indicating – monitoring – or testing – Including radiation storage or retrieval
Reexamination Certificate
2006-06-06
2006-06-06
Hindi, Nabil (Department: 2656)
Dynamic information storage or retrieval
Condition indicating, monitoring, or testing
Including radiation storage or retrieval
C369S053330
Reexamination Certificate
active
07057991
ABSTRACT:
An apparatus and method detecting whether a signal read from an optical disc has a defect. The apparatus generates a defect signal of an optical disc and includes an average maximum value detecting unit, an average minimum value detecting unit, an instantaneous maximum value detecting unit, an instantaneous minimum value detecting unit, and a defect signal generating unit. The average maximum value detecting unit receives a predetermined RF signal for a predetermined period of time and calculates an average maximum value of maximum values of the RF signal. The average minimum value detecting unit receives the predetermined RF signal for a predetermined period of time and calculates an average minimum value of minimum values of the RF signal. The instantaneous maximum value detecting unit receives the RF signal and calculates an instantaneous maximum value that is a maximum value of the RF signal at an instant of time when the RF signal is input. The instantaneous minimum value detecting unit receives the RF signal and calculates an instantaneous minimum value that is a minimum value of the RF signal at an instant of time when the RF signal is input. The defect signal generating unit receives the average maximum value, the average minimum value, the instantaneous maximum value, and the instantaneous minimum value and generates a defect signal indicating that the RF signal is abnormal, based on a predetermined peak threshold level and a predetermined bottom threshold level.
REFERENCES:
patent: 6172953 (2001-01-01), Kamiyama
patent: 6333902 (2001-12-01), Shim
patent: 2005/0088929 (2005-04-01), Tada et al.
Park Hyun-soo
Shim Jao-seong
Hindi Nabil
Pham Van
Samsung Electronics Co,. Ltd.
Stein, McEwen & Bui LLP
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