Optics: measuring and testing – By configuration comparison
Patent
1998-12-08
2000-05-30
Font, Frank G.
Optics: measuring and testing
By configuration comparison
356448, 356300, 356303, 356320, G01B 1100
Patent
active
060697024
ABSTRACT:
The present invention includes an apparatus configured for identification of a material, and methods of identifying a material. One embodiment of the invention provides an apparatus including a first region configured to receive a first sample, the first region being configured to output a first spectrum corresponding to the first sample and responsive to exposure of the first sample to radiation; a modulator configured to modulate the first spectrum according to a first frequency; a second region configured to receive a second sample, the second region being configured to output a second spectrum corresponding to the second sample and responsive to exposure of the second sample to the modulated first spectrum; and a detector configured to detect the second spectrum having a second frequency greater than the first frequency.
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Crawford Thomas M.
Slater John M.
Font Frank G.
Lockheed Martin Idaho Technologies Company
Ratliff Reginald A.
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