Method and adjustment for known good die testing using resilient

Details Method and adjustment for known good die testing using resilient Method and adjustment for known good die testing using resilient

1994-12-19

1996-04-23

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, 324755, G01R 1073

Patent

active

055107214

ABSTRACT:
A test apparatus for testing a know-good die integrated circuit is disclosed. The test apparatus uses conductive straps extending across trenches. The straps align with bond pads on the integrated circuit. When the bond pads are brought into contact with the straps, the straps exert a counterforce in the opposite direction to ensure a good electrical contact while testing the integrated circuit.

REFERENCES:
patent: 3588618 (1971-06-01), Otte
patent: 3670409 (1972-06-01), Reimer
patent: 4099991 (1978-07-01), Pops et al.
patent: 4487465 (1984-12-01), Cherian
patent: 4830622 (1989-05-01), Erickson et al.
patent: 4950173 (1990-08-01), Minemura et al.
patent: 5172050 (1992-12-01), Swapp
patent: 5339027 (1994-08-01), Woith et al.

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