Metallization contact structures and methods for forming...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S572000, C438S573000, C438S584000, C438S613000, C257SE21411, C257SE21413

Reexamination Certificate

active

07820540

ABSTRACT:
Metallization contact structures and methods for forming a multiple-layer electrode structure on solar cells include depositing a conductive contact layer on a semiconductor substrate and depositing a metal bearing ink onto a portion of the conductive contact layer, wherein exposed portions of the conductive contact layer are adjacent to the metal bearing ink. The conductive contact layer is patterned by removing exposed portions of the conductive contact layer from the semiconductor substrate. The metal bearing ink is aligned with openings in a dielectric layer of the semiconductor substrate and with unexposed portions of the conductive contact layer. The unexposed portions of the conductive contact layer are interposed between the metal bearing ink and the dielectric layer such that the conductive contact layer pattern is aligned with metal bearing ink. The semiconductor substrate is thermally processed to form a current carrying metal gridline by sintering the metal bearing ink.

REFERENCES:
patent: 4235644 (1980-11-01), Needes
patent: 6284562 (2001-09-01), Batlogg et al.
patent: 6814795 (2004-11-01), McVicker et al.
patent: 7061570 (2006-06-01), Imai
patent: 2002/0109149 (2002-08-01), Chang
patent: 2004/0200520 (2004-10-01), Mulligan et al.
patent: 2005/0022862 (2005-02-01), Cudzinovic et al.
patent: 2006/0102228 (2006-05-01), Sridharan et al.
patent: 2007/0169806 (2007-07-01), Fork et al.
patent: 2007/0221887 (2007-09-01), Kodas et al.
patent: 2007/0287237 (2007-12-01), Rockenberger et al.
patent: 2008/0011350 (2008-01-01), Luch
patent: 2008/0303037 (2008-12-01), Irving et al.
S.M. Sze “Semiconductor Devices. Physics and Technology. 2nd Edition”, (c) Wiley and Sons, 2002, chapter 9, figs. 41 and 42.
“Handbook of Photovoltaic Science and Engineering”, ed. Luque et al., (c) Wiley and Sons, 2002, p. 288.
“Handbook of Thin-Film Deposition Processes and Techniques—Principles, Methods, Equipment and Applications, 2nd Edition”, ed. by Kern et al., (c) William Andrew Publishing/Noyes, 2002, chapter 2, p. 13.
S.M Sze. “Semiconductor Devices. Physics and Technology”, 2nd edition, (C) 2002 John Wiley and Sons, chapter 9, figs. 41 and 42.
“Handbook of Photovoltaic Science and Engineering”, ed. by Luque et al., (C) 2003 John Wiley and Sons, p. 288.
“Handbook of Thin-Film Deposition Processes and Techniques—Principles, Methods, Equipment and Application”, 2nd edition, ed. by Kern et al., (C) 2002, William Andrew PublishingNoyes, chqapter 1, p. 13.
Kaydanova et al., “Direct Inkjet Printing of Composite Thin Barium Strontium Titanate Films,” J. Mater. Res., vol. 18, No 12, Dec. 2003.
Kaydanova et al., “Direct Write Contacts for Solar Cells,” Photovoltaic Specialists Conference, 2005.
Curtis et al., “Multi-layer Inkjet Printed Contacts for Silicon Solar Cells,” U.S. Department of Energy, 2006.
Mette et al., “Novel Metal Jet Printing Technique for the Front Side Metallization of Highly Efficient Industrial Silicon Solar Cells,” Fraunhofer Institute for Solar Energy Systems, Sep. 4, 2006.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Metallization contact structures and methods for forming... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Metallization contact structures and methods for forming..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metallization contact structures and methods for forming... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4187962

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.