Semiconductor device manufacturing: process – Semiconductor substrate dicing – With attachment to temporary support or carrier
Reexamination Certificate
2011-03-22
2011-03-22
Ho, Tu-Tu V (Department: 2818)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
With attachment to temporary support or carrier
C438S666000, C438S614000, C257S773000, C257S737000, C257S781000, C257SE21508, C257SE21599
Reexamination Certificate
active
07910460
ABSTRACT:
A metallic electrode forming method includes: forming a bed electrode on a substrate; forming a protective film with an opening on the bed electrode to expose the bed electrode from the opening; forming a metallic film covering the protective film and the opening; mounting the substrate on an adsorption stage, and measuring a surface shape of the metallic film by a surface shape measuring means; deforming the substrate by a deforming means so that a difference between the principal surface and a cutting surface is within a predetermined range; measuring a surface shape of the principal surface, and determining whether the difference is within a predetermined range; and cutting the substrate along with the cutting surface so that the metallic film is patterned to be a metallic electrode.
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Kojima Hisatoshi
Niimi Akihiro
Tomisaka Manabu
Denso Corporation
Ho Tu-Tu V
Posz Law Group , PLC
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